Showing results: 106 - 120 of 270 items found.
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STAr Technologies, Inc.
The silicon photonics and optronics market is growing fast in data centers, and more applications are looming on the horizon. STAr has over 20 years of integration test system experience and is able to design and manufacture test solutions to meet customer requirements for R&D, engineering, high-volume production, and reliability qualification.
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ScanWorks Embedded Diagnostics -
ASSET InterTech, Inc.
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.
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ScanExpress Runner -
Corelis, Inc.
Efficiency in engineering means managing your most precious resources: time and effort. Automated testing is essential and boundary-scan is a critical component; no other structural test system provides the same value.When down to the wire, your boundary-scan test system needs to be built both for ease-of-use and reliability; a robust and powerful mechanism to ensure that no matter the state of production, all boundary-scan tests can be quickly and faithfully executed to maintain forward momentum.
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TCIII-3200ST -
Triad Spectrum, Inc.
TurboCATS introduces a new line of redesigned TCIII-3200ST DDR4 and DDR3 multi-site module testing system - compact, high-performance, and equiped with enhanced productivity features. The TurboCATS TCIII-3200ST module test system features an optional 8, 16 or 64 module testing, in parallel, for high throughput on your production floor.
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Hypot® Series -
Associated Research
The Hypot Series sets the standard for safety and efficiency in production line Hipot Testing. Whether your application requires AC Withstand tests, DC Withstand tests, or Insulation Resistance tests, The Hypot Series provides innovations that will allow you to begin achieving best practices for safety and efficiency without the need for an expensive automated test system or connection to a PC. You can even connect the Hypot Series with the HYAMP Series to form a seamless safety compliance system for Hipot and Ground Bond Testing.
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OAI
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Amida Technology, Inc.
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Pilot 4D M4 -
SEICA SpA
The Pilot 4D M4 is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs, from prototypes to small/medium production volume, through the repair of field returns and reverse engineering. The vertical, compact architecture and the excellent board clamping system ensure that there is no oscillation of the board under test, which in turn greatly facilitates the precise positioning of the probes on the test points.
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ET Power Systems Ltd.
Electronic test engineers use a variety of precision instruments for R&D, vendor verification, and production testing. ETPS can supply a number of general test instruments that can be used in stand alone mode or automated for high throughput testing. Dedicated battery test systems with automatic charge and discharge modes with data logging are available. The standard 16 and 32 channel systems have range up to 5VDC ensuring their suitability for a wide variety of cells.
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Ball Systems, Inc.
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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LPDDR4 and LPDDR3 -
Triad Spectrum, Inc.
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Sentinel I -
Chroma Systems Solutions, Inc.
The Sentinel I System provides fully automated Electrical Safety Testing to IEC/EN/UL/CSA 60601-1. This system is ideal for testing medical products with one or no patient connections or low volume production where operators can manually change leads between different patient connections. This is a 5 in one Hipot test system that can test Hipot, Ground Bond, Insulation Resistance, Patient Leakage, Earth Line Leakage, Enclosure Leakage and Patient Auxiliary Leakage.
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T5851 -
Advantest Corp.
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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SS3250 / SS3252 / SS3302 -
Sanshine Electronis Co., Ltd.
Automatic transformer test instrument is a precision test system, designed for transformer production line or incoming/outgoing inspection in quality control process, with high stability and high reliability. With the enhanced capability in turn ratio measurement, they can solve the measuring problems of low coupling coefficient, transformer's turn ratio and turn number with more precise measurement.
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Test Head Engineering, LLC
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
